15 January 1988 Electronic Speckle Pattern Interferometry
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Proceedings Volume 0673, Holography Applications; (1988); doi: 10.1117/12.939087
Event: Holography Applications, 1986, Beijing, China
Abstract
The basic principles of electronic speckle pattern interferometry (ESPI) are described, stressing its close similarity to hologram interferometry. The technique's applications for vibration and deformation testing within industrial and medical research are outlined. Future developments are discussed.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ole J. Lokberg, "Electronic Speckle Pattern Interferometry", Proc. SPIE 0673, Holography Applications, (15 January 1988); doi: 10.1117/12.939087; https://doi.org/10.1117/12.939087
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