Paper
15 January 1988 Optical Testing Using A Point Diffraction Holographic Interferometer
Zhou Wanzhi, Lu Zhenwu
Author Affiliations +
Proceedings Volume 0673, Holography Applications; (1988) https://doi.org/10.1117/12.939076
Event: Holography Applications, 1986, Beijing, China
Abstract
A new interferometer, the Point Diffraction Holographic Interferometer (PDHI), is described in this paper, which covers its principle, structure, applications and error analysis. It is shown that this interferometer has some advantages over the conventional Point Diffraction Interferometer (PDI) such as easy alignment and adjustable visibility. It can be used for routine optical testing in optical shops or laboratories.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhou Wanzhi and Lu Zhenwu "Optical Testing Using A Point Diffraction Holographic Interferometer", Proc. SPIE 0673, Holography Applications, (15 January 1988); https://doi.org/10.1117/12.939076
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