The Study Of Speckle Pattern And Surface Roughness Measurement With Image Processing Technique

Zhang Qing-chuan; Xu Bo-qin; Wu Xiao-ping

doi:10.1117/12.939094

15 January 1988 The Study Of Speckle Pattern And Surface Roughness Measurement With Image Processing Technique

Zhang Qing-chuan, Xu Bo-qin, Wu Xiao-ping

Proceedings Volume 0673, Holography Applications; (1988) https://doi.org/10.1117/12.939094
Event: Holography Applications, 1986, Beijing, China

Abstract

Digital image processing technique for investigating the statistical properties of speckle pattern and measuring surface roughness is described firstly. With the aid of Model-75 Image Processing System, a speckle pattern can be processed within a minute.

Citation Download Citation

Zhang Qing-chuan, Xu Bo-qin, and Wu Xiao-ping "The Study Of Speckle Pattern And Surface Roughness Measurement With Image Processing Technique", Proc. SPIE 0673, Holography Applications, (15 January 1988); https://doi.org/10.1117/12.939094

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