15 January 1988 The Study Of Speckle Pattern And Surface Roughness Measurement With Image Processing Technique
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Proceedings Volume 0673, Holography Applications; (1988) https://doi.org/10.1117/12.939094
Event: Holography Applications, 1986, Beijing, China
Abstract
Digital image processing technique for investigating the statistical properties of speckle pattern and measuring surface roughness is described firstly. With the aid of Model-75 Image Processing System, a speckle pattern can be processed within a minute.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhang Qing-chuan, Zhang Qing-chuan, Xu Bo-qin, Xu Bo-qin, Wu Xiao-ping, Wu Xiao-ping, } "The Study Of Speckle Pattern And Surface Roughness Measurement With Image Processing Technique", Proc. SPIE 0673, Holography Applications, (15 January 1988); doi: 10.1117/12.939094; https://doi.org/10.1117/12.939094
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