Use Of Fringe Scanning Method In Electron Holographic Interferometry

Toyohiko Yatagai; Katsuyuki Ohmura; Shigeo Iwasaki; Akira Tonomura; Junji Endo; Shuji Hasegawa

doi:10.1117/12.939026

15 January 1988 Use Of Fringe Scanning Method In Electron Holographic Interferometry

Toyohiko Yatagai, Katsuyuki Ohmura, Shigeo Iwasaki, Akira Tonomura, Junji Endo, Shuji Hasegawa

Proceedings Volume 0673, Holography Applications; (1988) https://doi.org/10.1117/12.939026
Event: Holography Applications, 1986, Beijing, China

Abstract

Phase analysis technique for reconstructed images of an electron holographic microscope is described. The fringe scanning method is applied to gain high sensitivity in phase detection. An example of measuring a magnetic field of a fine particle is presented. The measurement accuracy in the case of median filtering is about 1/70 fringe.

Citation Download Citation

Toyohiko Yatagai, Katsuyuki Ohmura, Shigeo Iwasaki, Akira Tonomura, Junji Endo, and Shuji Hasegawa "Use Of Fringe Scanning Method In Electron Holographic Interferometry", Proc. SPIE 0673, Holography Applications, (15 January 1988); https://doi.org/10.1117/12.939026

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