15 January 1988 Use Of Fringe Scanning Method In Electron Holographic Interferometry
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Proceedings Volume 0673, Holography Applications; (1988); doi: 10.1117/12.939026
Event: Holography Applications, 1986, Beijing, China
Abstract
Phase analysis technique for reconstructed images of an electron holographic microscope is described. The fringe scanning method is applied to gain high sensitivity in phase detection. An example of measuring a magnetic field of a fine particle is presented. The measurement accuracy in the case of median filtering is about 1/70 fringe.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toyohiko Yatagai, Katsuyuki Ohmura, Shigeo Iwasaki, Akira Tonomura, Junji Endo, Shuji Hasegawa, "Use Of Fringe Scanning Method In Electron Holographic Interferometry", Proc. SPIE 0673, Holography Applications, (15 January 1988); doi: 10.1117/12.939026; https://doi.org/10.1117/12.939026
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