This review is restricted to the historical development and the present facilities at the NPRL for the design and evaluation of axially symmetric imaging electron optics. The basic mathematical problem is briefly defined. The numerical method applied and developed to solve the mathematical problem for real axially symmetric devices and their characteristics is summarized. The computer facilities that have been used since 1970 for the development and operation of the electron optics software are reviewed. The capabilities and efficiency of the present software and hardware systems are discussed in some detail. To enable evaluation of the quality of the electron optics of experimental imaging devices, an experimental electron optics bench and ancillary equipment for image quality assessment were also established. These experi-mental aids are also briefly described.