This paper presents the results of a full three-dimensional analysis of a new type of reflecting baffle vane cavity proposed by Dr. William Linlor of NASA's Ames Research Center. The analysis is divided into two separate parts. The first employs advanced geometrical ray tracing techniques (the ASAP/RABET computer program) to the analyze the specular reflecting properties of the cavities. The second part uses deterministic radiation transfer methods (a later version of the APART/PADE stray radiation analysis program) to analyze the diffuse scattering properties of the reflecting cavities relative to absorbing ones. In both cases, an operating wavelength of 10.6 microns is initially used. These results are then used to estimate the performance at 2.0 microns.