3 June 1987 Effects Of Surface And Bulk Defects In Transmitting Materials On Optical Resolution And Scattered Light
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Abstract
The origin of scattered light, particularly near-angle scattered light, and its effect on optical resolution have been analyzed. Also, an instrument is described that can measure near-angle scatter. An application of Rayleigh and Mie scattering theories shows that a few large defects cause a high level of near-angle scatter, which leads to a loss of resolution. The degradation in resolution is severe when trying to resolve a bright object near a faint object. A relatively simple apparatus has been built that can measure near-angle scatter at angles as small as 0.03 degrees and at levels of 10-6 peak intensity.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H E Bennett, D W Ricks, "Effects Of Surface And Bulk Defects In Transmitting Materials On Optical Resolution And Scattered Light", Proc. SPIE 0675, Stray Radiation V, (3 June 1987); doi: 10.1117/12.939495; https://doi.org/10.1117/12.939495
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