PROCEEDINGS VOLUME 0679
30TH ANNUAL TECHNICAL SYMPOSIUM | 1-3 AUGUST 1986
Current Developments in Optical Engineering and Diffraction Phenomena
IN THIS VOLUME

1 Sessions, 26 Papers, 0 Presentations
All Papers  (26)
30TH ANNUAL TECHNICAL SYMPOSIUM
1-3 August 1986
San Diego, United States
All Papers
Proc. SPIE 0679, Current Materials For Gradient-Index Optics, 0000 (19 December 1986); https://doi.org/10.1117/12.939559
Proc. SPIE 0679, Optics Toolbox: An Intelligent Relational Database System For Optical Designers, 0000 (19 December 1986); https://doi.org/10.1117/12.939560
Proc. SPIE 0679, Practical Tilted Mirror Systems, 0000 (19 December 1986); https://doi.org/10.1117/12.939561
Proc. SPIE 0679, A Null-Lens Design Approach For Centrally Obscured Components, 0000 (19 December 1986); https://doi.org/10.1117/12.939562
Proc. SPIE 0679, Optimization Of An Unobscured Optical System Using Vector Aberration Theory, 0000 (19 December 1986); https://doi.org/10.1117/12.939563
Proc. SPIE 0679, Multizone Bifocal Contact Lens Design, 0000 (19 December 1986); https://doi.org/10.1117/12.939564
Proc. SPIE 0679, The Problem Of The "Concentric" Meniscus Element A Possible Solution To The Lens Designer's Dilemma, 0000 (19 December 1986); https://doi.org/10.1117/12.939565
Proc. SPIE 0679, Flight Of Optical Manufacturing To The Far East, 0000 (19 December 1986); https://doi.org/10.1117/12.939566
Proc. SPIE 0679, Optical Performance Of Molded-Glass Lenses For Optical Memory Applications, 0000 (19 December 1986); https://doi.org/10.1117/12.939567
Proc. SPIE 0679, Through-Wafer Optical Interconnects For Multi-Wafer Wafer-Scale Integrated Architectures, 0000 (19 December 1986); https://doi.org/10.1117/12.939568
Proc. SPIE 0679, The Measuring Method And Accuracy Of Thickness Of Optical Thin Film, 0000 (19 December 1986); https://doi.org/10.1117/12.939569
Proc. SPIE 0679, Optical Thin Film Monitoring Using Optical Fibers, 0000 (19 December 1986); https://doi.org/10.1117/12.939570
Proc. SPIE 0679, A Review Of Aero-Optical Measurements And Interpretation, 0000 (19 December 1986); https://doi.org/10.1117/12.939571
Proc. SPIE 0679, Laser And Electro-Optical Techniques In Dimensional Inspection, 0000 (19 December 1986); https://doi.org/10.1117/12.939572
Proc. SPIE 0679, The Role Of Polarization In The Measurement And Characterization Of Scattering, 0000 (19 December 1986); https://doi.org/10.1117/12.939573
Proc. SPIE 0679, Imaging System Model Crammed Into A 32K Microcomputer, 0000 (19 December 1986); https://doi.org/10.1117/12.939574
Proc. SPIE 0679, Exact Solutions In Closed Form For Fresnel Diffraction By A Semi-Infinite Plane And A Circular Disc, 0000 (19 December 1986); https://doi.org/10.1117/12.939575
Proc. SPIE 0679, Diffraction Of A Plane Electromagnetic Wave By A Flat Conducting Strip And By A Circular Conducting Channel, 0000 (19 December 1986); https://doi.org/10.1117/12.939576
Proc. SPIE 0679, Vector Formulation Of The Ray-Equivalent Method For General Gaussian Beam Propagation, 0000 (19 December 1986); https://doi.org/10.1117/12.939577
Proc. SPIE 0679, A Fast Algorithm For Diffraction Calculations, And Some Applications, 0000 (19 December 1986); https://doi.org/10.1117/12.939578
Proc. SPIE 0679, The Fourier Optical Analysis Of Aberrations In Focused Laser Beams, 0000 (19 December 1986); https://doi.org/10.1117/12.939579
Proc. SPIE 0679, Optimization Of High-Efficiency Multiplex Holograms By Fourier Space Formalism., 0000 (19 December 1986); https://doi.org/10.1117/12.939580
Proc. SPIE 0679, Moire Interferometry With Chromatic 1Ight, 0000 (19 December 1986); https://doi.org/10.1117/12.939581
Proc. SPIE 0679, Diffractive Diffusers For Display Applications, 0000 (19 December 1986); https://doi.org/10.1117/12.939582
Proc. SPIE 0679, Detector Responsivity Determination Using Pinhole Diffraction, 0000 (19 December 1986); https://doi.org/10.1117/12.939583
Proc. SPIE 0679, New High Resolution Phase Conjugated Optical Correctors For Diffraction Limited Applications, 0000 (19 December 1986); https://doi.org/10.1117/12.939584
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