Detector Responsivity Determination Using Pinhole Diffraction

Lawrence D Brooks

doi:10.1117/12.939583

19 December 1986 Detector Responsivity Determination Using Pinhole Diffraction

Lawrence D Brooks

Proceedings Volume 0679, Current Developments in Optical Engineering and Diffraction Phenomena; (1986) https://doi.org/10.1117/12.939583
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

A simple but accurate method is described for calibrating detector responsivity The method involves creating a far-field intensity pattern via diffraction from a circular aperture, and then computing the integrated irradiance over the detector area using well-known relations. No experimental verification has been performed, but several error sources are discussed and are expected to be small.

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Lawrence D Brooks "Detector Responsivity Determination Using Pinhole Diffraction", Proc. SPIE 0679, Current Developments in Optical Engineering and Diffraction Phenomena, (19 December 1986); https://doi.org/10.1117/12.939583

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KEYWORDS

Sensors

Diffraction

Calibration

Optical engineering

Bessel functions

Diffraction gratings

Signal attenuation

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