19 December 1986 Detector Responsivity Determination Using Pinhole Diffraction
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A simple but accurate method is described for calibrating detector responsivity The method involves creating a far-field intensity pattern via diffraction from a circular aperture, and then computing the integrated irradiance over the detector area using well-known relations. No experimental verification has been performed, but several error sources are discussed and are expected to be small.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lawrence D Brooks, Lawrence D Brooks, } "Detector Responsivity Determination Using Pinhole Diffraction", Proc. SPIE 0679, Current Developments in Optical Engineering and Diffraction Phenomena, (19 December 1986); doi: 10.1117/12.939583; https://doi.org/10.1117/12.939583

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