PROCEEDINGS VOLUME 0680
30TH ANNUAL TECHNICAL SYMPOSIUM | 1-3 AUGUST 1986
Surface Characterization and Testing
Editor(s): Katherine Creath
IN THIS VOLUME

1 Sessions, 23 Papers, 0 Presentations
All Papers  (23)
30TH ANNUAL TECHNICAL SYMPOSIUM
1-3 August 1986
San Diego, United States
All Papers
Proc. SPIE 0680, Current State Of Optical Testiny, 0000 (23 March 1987); doi: 10.1117/12.939585
Proc. SPIE 0680, Programmable Interferometry, 0000 (23 March 1987); doi: 10.1117/12.939586
Proc. SPIE 0680, Comparison Of Phase-Measurement Algorithms, 0000 (23 March 1987); doi: 10.1117/12.939587
Proc. SPIE 0680, Phase-Measuring Interferometry Performance Parameters, 0000 (23 March 1987); doi: 10.1117/12.939588
Proc. SPIE 0680, Real-Time Snapshot Interferometer, 0000 (23 March 1987); doi: 10.1117/12.939589
Proc. SPIE 0680, Testing Collimation Using Shearing Interferometry, 0000 (23 March 1987); doi: 10.1117/12.939590
Proc. SPIE 0680, Influeace Of System Aberrations On Interferometric Aspheric Surface Testing, 0000 (23 March 1987); doi: 10.1117/12.939591
Proc. SPIE 0680, Testing The Primary Mirror Of The W. M. Keck Observatory, 0000 (23 March 1987); doi: 10.1117/12.939592
Proc. SPIE 0680, Phase-Measuring Interferometric Testing Of Large Diamond-Turned Optics, 0000 (23 March 1987); doi: 10.1117/12.939593
Proc. SPIE 0680, Intensity Distribution In Out-Of-Focus Images Of A Rotationally Symmetric Optical System, 0000 (23 March 1987); doi: 10.1117/12.939594
Proc. SPIE 0680, Automated Interferometric System For Aspheric Surface Testing, 0000 (23 March 1987); doi: 10.1117/12.939595
Proc. SPIE 0680, Aspheric Surface Figure Measurement Using Mechanical Profilometry, 0000 (23 March 1987); doi: 10.1117/12.939596
Proc. SPIE 0680, Scratch And Dig Measurement - A Way Ahead, 0000 (23 March 1987); doi: 10.1117/12.939597
Proc. SPIE 0680, Subsurface Damage In The Diamond Generation Of Aspherics, 0000 (23 March 1987); doi: 10.1117/12.939598
Proc. SPIE 0680, Comments On The Correlation Length, 0000 (23 March 1987); doi: 10.1117/12.939599
Proc. SPIE 0680, Longscan Surface Profile Measurements Using A Phase-Modulated Mirau Interferometer, 0000 (23 March 1987); doi: 10.1117/12.939600
Proc. SPIE 0680, High Resolution Optical Profilometer, 0000 (23 March 1987); doi: 10.1117/12.939601
Proc. SPIE 0680, Structure Effects In Optical Surface Metrology, 0000 (23 March 1987); doi: 10.1117/12.939602
Proc. SPIE 0680, Comparison Of Profiler Measurements Using Different Magnification Objectives, 0000 (23 March 1987); doi: 10.1117/12.939603
Proc. SPIE 0680, Use Of The WYKO And Sommargren Profilers In Polishing Research, 0000 (23 March 1987); doi: 10.1117/12.939604
Proc. SPIE 0680, A Description Of Scattering Of Light From A Rough Surface And Measurements Of The Surface Topography Of A Metal, 0000 (23 March 1987); doi: 10.1117/12.939605
Proc. SPIE 0680, An Instrument For Measurement Of Surface Scatter In The Presence Of Bulk Scatter, 0000 (23 March 1987); doi: 10.1117/12.939606
Proc. SPIE 0680, Application Of Fourier Optical Signal Processing To Detect Surface Flaws In Transmissive And Reflective Materials, 0000 (23 March 1987); doi: 10.1117/12.939607
Back to Top