9 March 1987 Application Of Synchrotron Radiation To X-Ray Fluorescence Analysis Of Trace Elements
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Abstract
The development of synchrotron radiation x-ray sources has provided the means to greatly extend the capabilities of x-ray fluorescence analysis for determinations of trace element concentrations. A brief description of synchrotron radiation properties provides a background for a discussion of the improved detection limits compared to existing x-ray fluorescence techniques. Calculated detection limits for x-ray microprobes with micrometer spatial resolutions are described and compared with experimental results beginning to appear from a number of laboratories. The current activities and future plans for a dedicated x-ray microprobe beam line at the National Synchrotron Light Source (NSLS) of Brookhaven National Laboratory are presented.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B M Gordon, B M Gordon, K W Jones, K W Jones, A L Hanson, A L Hanson, } "Application Of Synchrotron Radiation To X-Ray Fluorescence Analysis Of Trace Elements", Proc. SPIE 0681, Laser and Nonlinear Optical Materials, (9 March 1987); doi: 10.1117/12.939624; https://doi.org/10.1117/12.939624
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