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19 December 1986 Compressive Thin Films For Increased Fracture Toughness
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Abstract
Improved fracture toughness by as much as a factor of two in infrared window materials has been observed after the deposition of thin compressive surface films by reactive ion beam techniques. The relationship between film stress, film thickness, substrate properties, and observed fracture toughness are being investigated, using Vickers indentation to determine mechanical properties and a bending plate capacitance method to independently determine film stress. Comparisons are made to a theoretical model developed by Lawn and Fuller.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. H. Kobrin and A. B. Harker "Compressive Thin Films For Increased Fracture Toughness", Proc. SPIE 0683, Infrared and Optical Transmitting Materials, (19 December 1986); https://doi.org/10.1117/12.936429
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