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9 April 1987 Study of Multilayered X-UV Polarizers and Consequence of the Use of Partially Polarized Light on Absolute Reflectivity Measurements
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Abstract
An X-UV polarimeter with a rotating 45° angle of incidence multilayer as polarizer has been built and used to measure the polarization rates of the 154A and 304A light after monochromators. Due to the good polarization of the synchrotron source, polarization rates around of 70% have been measured.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Khandar, P. Dhez, and M. Berland "Study of Multilayered X-UV Polarizers and Consequence of the Use of Partially Polarized Light on Absolute Reflectivity Measurements", Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, (9 April 1987); https://doi.org/10.1117/12.964841
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