PROCEEDINGS VOLUME 0689
30TH ANNUAL TECHNICAL SYMPOSIUM | 1-3 AUGUST 1986
X-Ray Calibration: Techniques, Sources, and Detectors
IN THIS VOLUME

1 Sessions, 33 Papers, 0 Presentations
All Papers  (33)
30TH ANNUAL TECHNICAL SYMPOSIUM
1-3 August 1986
San Diego, United States
All Papers
Proc. SPIE 0689, Absolute Intensity Measurements In The Vacuum Ultraviolet, 0000 (12 August 1986); doi: 10.1117/12.936556
Proc. SPIE 0689, A Penning Discharge Source For Extreme Ultraviolet Calibration, 0000 (12 August 1986); doi: 10.1117/12.936557
Proc. SPIE 0689, A High Intensity Line Source For X-Ray Spectrometer Calibration, 0000 (12 August 1986); doi: 10.1117/12.936558
Proc. SPIE 0689, Laser Produced Plasma X-Ray Ultraviolet (XUV) Radiation Source, 0000 (12 August 1986); doi: 10.1117/12.936559
Proc. SPIE 0689, Maximization Of Bremsstrahlung And K-Series Production Efficiencies In Flash X-Ray Tubes, 0000 (12 August 1986); doi: 10.1117/12.936560
Proc. SPIE 0689, Variable Pressure Ion Chamber For Relative And Absolute Flux Measurement, 0000 (12 August 1986); doi: 10.1117/12.936561
Proc. SPIE 0689, Calibration Of Photon Counting Imaging Microchannel Plate Detectors For EUV Astronomy, 0000 (12 August 1986); doi: 10.1117/12.936562
Proc. SPIE 0689, Calibration Of A 1 Meter Diameter Normal Incidence Extreme Ultraviolet Telescope/Spectrometer, 0000 (12 August 1986); doi: 10.1117/12.936563
Proc. SPIE 0689, Absolute Sensitivity Calibration from 20 to 430 of a Grazing Incidence Spectrometer with a Multi-element Spectral Detector, 0000 (12 August 1986); doi: 10.1117/12.936564
Proc. SPIE 0689, A Slitless, Intensified Readout, Gated Spectrometer: Wavelength And Efficiency Calibration, Time Response Characterization, 0000 (12 August 1986); doi: 10.1117/12.936565
Proc. SPIE 0689, VUV Spectrometer-Detector System Calibration Using Synchrotron Radiation, 0000 (12 August 1986); doi: 10.1117/12.936566
Proc. SPIE 0689, Synchrotron Radiation Calibration of the SPRED VUV Spectograph at the NBS SURF II Electron Storage Ring, 0000 (12 August 1986); doi: 10.1117/12.936567
Proc. SPIE 0689, Wolter X-Ray Microscope Calibration, 0000 (12 August 1986); doi: 10.1117/12.936568
Proc. SPIE 0689, Characterization Of The Absolute Photon Sensitivity Of Gold Cathode Photoelectric Detectors, 0000 (12 August 1986); doi: 10.1117/12.936569
Proc. SPIE 0689, Techniques Of Absolute Low Energy X-Ray Calibration, 0000 (12 August 1986); doi: 10.1117/12.936570
Proc. SPIE 0689, Optical Surface Evaluation By Soft X-Ray Scattering, 0000 (12 August 1986); doi: 10.1117/12.936571
Proc. SPIE 0689, Evaluation of Gratings for the Extreme Ultraviolet Explorer, 0000 (12 August 1986); doi: 10.1117/12.936572
Proc. SPIE 0689, Crystal R[sub]c[/sub] Calibrations with an Uncollimated, Point X-Ray Source, 0000 (12 August 1986); doi: 10.1117/12.936573
Proc. SPIE 0689, Soft X-Ray Calibration of Diffracting Materials, 0000 (12 August 1986); doi: 10.1117/12.936574
Proc. SPIE 0689, Development and Performance of the Radiation Entrance Window in the ROSAT Position Sensitive Proportional Counter PSPC, 0000 (12 August 1986); doi: 10.1117/12.936575
Proc. SPIE 0689, Calibration of the Thin Film Filters to be Used on the Extreme Ultraviolet Explorer Satellite, 0000 (12 August 1986); doi: 10.1117/12.936576
Proc. SPIE 0689, Absolute Calibration of a Soft X-Ray Streak Camera, 0000 (12 August 1986); doi: 10.1117/12.936577
Proc. SPIE 0689, Facilities and Techniques for X-Ray Diagnostic Calibration in the 100-eV to 100-keV Energy Range, 0000 (12 August 1986); doi: 10.1117/12.936578
Proc. SPIE 0689, The Soft X-Ray/EUV Calibration Facility at the University of Colorado, 0000 (12 August 1986); doi: 10.1117/12.936579
Proc. SPIE 0689, XUV Radiometric Standards at NBS, 0000 (12 August 1986); doi: 10.1117/12.936580
Proc. SPIE 0689, Synchrotron Radiation Beam Lines As X-Ray Calibration Sources, 0000 (12 August 1986); doi: 10.1117/12.936581
Proc. SPIE 0689, VUV-Soft X-Ray Beamline For Spectroscopy And Calibration, 0000 (12 August 1986); doi: 10.1117/12.936582
Proc. SPIE 0689, Los Alamos X-Ray Characterization Facilities For Plasma Diagnostics, 0000 (12 August 1986); doi: 10.1117/12.936583
Proc. SPIE 0689, Vacuum Interface To A Soft X-Ray Synchrotron Beam Line, 0000 (12 August 1986); doi: 10.1117/12.936584
Proc. SPIE 0689, Problems And Approaches To The Calibration Of Solar EUV Instrumentation In Space, 0000 (12 August 1986); doi: 10.1117/12.936585
Proc. SPIE 0689, Performance of Oblique Angle of Incidence Collection Systems in the VUV, 0000 (12 August 1986); doi: 10.1117/12.936586
Proc. SPIE 0689, Tokamak as an X-Ray/XUV Light Source, 0000 (12 August 1986); doi: 10.1117/12.936587
Proc. SPIE 0689, Direct X-Ray Response Of Charge-Coupled Devices And Photodiode Linear Arrays, 0000 (12 August 1986); doi: 10.1117/12.936588
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