Los Alamos X-Ray Characterization Facilities For Plasma Diagnostics

Robert H. Day; Richard L. Blake; Gary L. Stradling; Walter J. Trela; Roger J. Bartlett

doi:10.1117/12.936583

12 August 1986 Los Alamos X-Ray Characterization Facilities For Plasma Diagnostics

Robert H. Day, Richard L. Blake, Gary L. Stradling, Walter J. Trela, Roger J. Bartlett

Proceedings Volume 0689, X-Ray Calibration: Techniques, Sources, and Detectors; (1986) https://doi.org/10.1117/12.936583
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

A summary is given of characteristics of x-ray sources used by Los Alamos National Laboratory to calibrate various x-ray diagnostic packages and components. Included are D.C. sources in electron impact and fluorescence modes, a pulsed laser source for soft x rays with 100 ps time resolution, Febetron pulsed electron impact sources, and both EUV and x-ray synchrotron beamlines.

Citation Download Citation

Robert H. Day, Richard L. Blake, Gary L. Stradling, Walter J. Trela, and Roger J. Bartlett "Los Alamos X-Ray Characterization Facilities For Plasma Diagnostics", Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); https://doi.org/10.1117/12.936583

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