12 August 1986 VUV Spectrometer-Detector System Calibration Using Synchrotron Radiation
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A method of absolute calibration of a VUV spectrometer-detector system is presented in which continuum synchrotron radiation is used. Calibration of the optical system is performed for the purpose of absolute measurements of electron impact photoemission cross sections for discrete atomic (molecular) transitions in the VUV wavelength region. A large computer-controlled multiadjustable manipulator is used for positioning the spectrometer-detector system with respect to a beam of synchrotron radiation. The manipulator allows rotation with respect to two perpendicular axes, one collinear with the electron beam, and the other collinear with the spectrometer entrance slit. Using these rotations, a beam of synchrotron radiation is scanned across the grating surface resulting in a precise simulation of the source geometry encountered in the electron-atom collision source. In this way the absolute response of the spectrometer-detector system and the geometrical factors encountered in the electron-atom source are determined in an integral fashion allowing absolute photoemission cross sections to be determined with unparalleled precision.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Armon McPherson, Ned Rouze, David Graves, Willem B. Westerveld, John S. Risley, "VUV Spectrometer-Detector System Calibration Using Synchrotron Radiation", Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); doi: 10.1117/12.936566; https://doi.org/10.1117/12.936566


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