PROCEEDINGS VOLUME 0690
30TH ANNUAL TECHNICAL SYMPOSIUM | 1-3 AUGUST 1986
X-Rays in Materials Analysis: Novel Applications and Recent Developments
Editor(s): Thomas W. Rusch
IN THIS VOLUME

1 Sessions, 23 Papers, 0 Presentations
All Papers  (23)
30TH ANNUAL TECHNICAL SYMPOSIUM
1-3 August 1986
San Diego, United States
All Papers
Proc. SPIE 0690, Refinements in XAFS Theory, 0000 (12 August 1986); https://doi.org/10.1117/12.936590
Proc. SPIE 0690, Comparison Of Experimental And Theoretical Calculations Of Backscattering Amplitude And Phase Shift Functions For A Number Of FCC Metals, 0000 (12 August 1986); https://doi.org/10.1117/12.936591
Proc. SPIE 0690, Experimental Studies Of Photon-Surface Interaction Dynamics In The Alkali Halides, 0000 (12 August 1986); https://doi.org/10.1117/12.936592
Proc. SPIE 0690, Time-Dependent X-Ray Reflectivity of a Germanium Crystal Heated with 25 ps 1.06 µm Laser Light, 0000 (12 August 1986); https://doi.org/10.1117/12.936593
Proc. SPIE 0690, Characteristics Of Transition Radiation In The X-Ray Spectral Region, 0000 (12 August 1986); https://doi.org/10.1117/12.936594
Proc. SPIE 0690, EXAFS And Reflectivity Studies Of Surfaces And Interfaces Using Glancing Angle X-Rays, 0000 (12 August 1986); https://doi.org/10.1117/12.936595
Proc. SPIE 0690, Near Edge X-Ray Absorption Fine Structure Spectroscopy In Materials Analysis, 0000 (12 August 1986); https://doi.org/10.1117/12.936596
Proc. SPIE 0690, EXAFS Measurements Of Ion-Implanted Amorphous Surface Layers, 0000 (12 August 1986); https://doi.org/10.1117/12.936597
Proc. SPIE 0690, Structure of Icosahedral AlMnSi and AlMn as Determined by Extended X-Ray Absorption Fine Structure (EXAFS), 0000 (12 August 1986); https://doi.org/10.1117/12.936598
Proc. SPIE 0690, Local Structural And Magnetic Environments Of Iron In Dilute Alloys, 0000 (12 August 1986); https://doi.org/10.1117/12.936599
Proc. SPIE 0690, Economical and Efficient Detector for Fluorescent X-Ray Absorption Spectroscopy, 0000 (12 August 1986); https://doi.org/10.1117/12.936600
Proc. SPIE 0690, Surface and Epitaxial Overlayer Structures from X-Ray Photoelectron Diffraction (XPD), 0000 (12 August 1986); https://doi.org/10.1117/12.936601
Proc. SPIE 0690, Angle Resolved X-ray Photoelectron Spectroscopy Applied to Patchy Surfaces, 0000 (12 August 1986); https://doi.org/10.1117/12.936602
Proc. SPIE 0690, Thin Layer Formation Studied by Angular Dependent X-Ray Photoelectron Spectroscopy, 0000 (12 August 1986); https://doi.org/10.1117/12.936603
Proc. SPIE 0690, X-Ray Photoelectron Spectroscopy (XPS) Applications Using Microfocused X-Rays, 0000 (12 August 1986); https://doi.org/10.1117/12.936604
Proc. SPIE 0690, An Investigation Of The Effect Of Particle Size On Oxidation Of Pyrites In Coal., 0000 (12 August 1986); https://doi.org/10.1117/12.936605
Proc. SPIE 0690, The Application of X-rays and Electrochemistry to Materials Analysis, 0000 (12 August 1986); https://doi.org/10.1117/12.936606
Proc. SPIE 0690, Problems in Quantitation in X-Ray Photoelectron Spectroscopy (XPS): the Use of Data Reduction Techniques to Obtain Peak Areas, 0000 (12 August 1986); https://doi.org/10.1117/12.936607
Proc. SPIE 0690, Surface Structure Analysis Using Grazing Incidence X-ray Scattering, 0000 (12 August 1986); https://doi.org/10.1117/12.936608
Proc. SPIE 0690, X-Ray Diffraction of CdTe Epitaxial Layers on GaAs Substrates as a Function of Temperature, 0000 (12 August 1986); https://doi.org/10.1117/12.936609
Proc. SPIE 0690, Structural Depth Profiling by Glancing Angle X-ray Diffraction, 0000 (12 August 1986); https://doi.org/10.1117/12.936610
Proc. SPIE 0690, Measurement of X-Ray Dielectric Constants With Coherent Transition Radiation, 0000 (12 August 1986); https://doi.org/10.1117/12.936611
Proc. SPIE 0690, Time Resolved X-Ray Diffraction Measurements Of Phase Transitions In Lipid-Water Systems, 0000 (12 August 1986); https://doi.org/10.1117/12.936612
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