12 August 1986 Near Edge X-Ray Absorption Fine Structure Spectroscopy In Materials Analysis
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Abstract
Near Edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy is a recently developed tool which is used to determine angular orientation and bond lengths of small molecules which adsorbed onto surfaces. Polarized soft x-rays from a synchrotron radiation source cause electronic transitions from core levels into unfilled molecular orbitals near the vacuum level. Many small molecules have unfilled it and a symmetry orbitals, and dipole selection rules cause these transitions to be highly polarization dependent. By rotating the sample with respect to the photon beam, one observes this polarization dependence, and from this the angular orientations of the chemical bonds are inferred. The technique is less model dependent than conventional techniques such as LEED and HREELS, and has been used to determine a number of orientations with confidence. The spectra also yield information about the lengths of the bonds from which structural models may be constructed for the surface + adsorbate system.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roger Carr, "Near Edge X-Ray Absorption Fine Structure Spectroscopy In Materials Analysis", Proc. SPIE 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments, (12 August 1986); doi: 10.1117/12.936596; https://doi.org/10.1117/12.936596
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