12 August 1986 Surface Structure Analysis Using Grazing Incidence X-ray Scattering
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Abstract
A description of the Grazing Incidence X-ray Scattering technique is presented including examples of the wide variety of work being performed in the areas of ordered overlayer structure determination, phase transition studies of ordered overlayers and structural studies of thin amorphous films.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Brennan, S. Brennan, "Surface Structure Analysis Using Grazing Incidence X-ray Scattering", Proc. SPIE 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments, (12 August 1986); doi: 10.1117/12.936608; https://doi.org/10.1117/12.936608
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