Surface and Epitaxial Overlayer Structures from X-Ray Photoelectron Diffraction (XPD)

Charles S. Fadley

doi:10.1117/12.936601

12 August 1986 Surface and Epitaxial Overlayer Structures from X-Ray Photoelectron Diffraction (XPD)

Charles S. Fadley

Proceedings Volume 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments; (1986) https://doi.org/10.1117/12.936601
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

The use of x-ray photoelectron diffraction (XPD) for studies of surface and epitaxial overlayer structures is reviewed. XPD is found to provide several direct and rather unique types of structural information, including the sites and positions of adsorbed atoms, the orientations of small molecules or fragments bonded to surfaces, the layer thicknesses and morphologies of epitaxial or partially epitaxial overlayers, and short-range spin order in magnetic materials. A rather straightforward single scattering model also proves capable of quantitatively describing such data for near-surface species. New directions in such studies also include measurements with high angular resolution and expanded use of synchrotron radiation.

Citation Download Citation

Charles S. Fadley "Surface and Epitaxial Overlayer Structures from X-Ray Photoelectron Diffraction (XPD)", Proc. SPIE 0690, X-Rays in Materials Analysis: Novel Applications and Recent Developments, (12 August 1986); https://doi.org/10.1117/12.936601

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