PROCEEDINGS VOLUME 0691
30TH ANNUAL TECHNICAL SYMPOSIUM | 1-3 AUGUST 1986
X-Ray Imaging II
IN THIS VOLUME

1 Sessions, 19 Papers, 0 Presentations
All Papers  (19)
30TH ANNUAL TECHNICAL SYMPOSIUM
1-3 August 1986
San Diego, United States
All Papers
Proc. SPIE 0691, Measured 1 to 40 keV Photoabsorption Cross Sections for: Fe, Ni, Sn, Ta, Pt, Au, Pb, U, 0000 (12 August 1986); https://doi.org/10.1117/12.936614
Proc. SPIE 0691, Normal Incidence Reflection Multilayer Optics for Solar Soft X-Ray/Extreme Ultraviolet (XUV) Observations, 0000 (12 August 1986); https://doi.org/10.1117/12.936615
Proc. SPIE 0691, Metal Reflectors in the EUV, 0000 (12 August 1986); https://doi.org/10.1117/12.936616
Proc. SPIE 0691, Simultaneous, Nondestructive Analysis Of Thickness And Composition Of Multilayer Metal Films Using A Fundamental Parameter XRF Approach., 0000 (12 August 1986); https://doi.org/10.1117/12.936617
Proc. SPIE 0691, Imaging at Soft X-ray Wavelengths with High-Gain Microchannel Plate Detector Systems, 0000 (12 August 1986); https://doi.org/10.1117/12.936618
Proc. SPIE 0691, The performance of CCD array detectors for application in high-resolution tomography, 0000 (12 August 1986); https://doi.org/10.1117/12.936619
Proc. SPIE 0691, X-Ray Multilayer Optic Development For Plasma Diagnostic And Source Enhancement, 0000 (12 August 1986); https://doi.org/10.1117/12.936620
Proc. SPIE 0691, Monochromatization By Multilayered Optics On A Cylindrical Reflector And On An Ellipsoidal Focusing Ring, 0000 (12 August 1986); https://doi.org/10.1117/12.936621
Proc. SPIE 0691, Curved Silicon Substrates For Multilayer Structures, 0000 (12 August 1986); https://doi.org/10.1117/12.936622
Proc. SPIE 0691, Theoretical Considerations in the Design of Multilayer X-Ray Optics, 0000 (12 August 1986); https://doi.org/10.1117/12.936623
Proc. SPIE 0691, Multilayer X-Ray Imaging Systems, 0000 (12 August 1986); https://doi.org/10.1117/12.936624
Proc. SPIE 0691, X-ray Microtomography with Synchrotron Radiation, 0000 (12 August 1986); https://doi.org/10.1117/12.936625
Proc. SPIE 0691, Radiographic Imaging at Medium Energies Using Multilayer Mirrors, 0000 (12 August 1986); https://doi.org/10.1117/12.936626
Proc. SPIE 0691, X-Ray Fluorescence (XRF) Testing for Thickness in On-Site Controlled Construction of Specialty Coatings, 0000 (12 August 1986); https://doi.org/10.1117/12.936627
Proc. SPIE 0691, An Undulator Based Scanning Microscope At The National Synchrotron Light Source, 0000 (12 August 1986); https://doi.org/10.1117/12.936628
Proc. SPIE 0691, Soft X-ray Imaging System for Measurement of Noncircular Tokamak Plasmas, 0000 (12 August 1986); https://doi.org/10.1117/12.936629
Proc. SPIE 0691, Optics For X-Ray Astronomy, 0000 (12 August 1986); https://doi.org/10.1117/12.936630
Proc. SPIE 0691, Design, Analysis, Fabrication and Test of the LAMAR Protoflight Mirror Assembly, 0000 (12 August 1986); https://doi.org/10.1117/12.936631
Proc. SPIE 0691, The Measured Performance Of A Grazing Incidence Relay Optics Telescope For Solar X-Ray Astronomy, 0000 (12 August 1986); https://doi.org/10.1117/12.936632
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