An Undulator Based Scanning Microscope At The National Synchrotron Light Source

H. Rarback; D. Shu; H. Ade; C. Jacobsen; J. Kirzi; I. McNulty; R. Rosser

doi:10.1117/12.936628

12 August 1986 An Undulator Based Scanning Microscope At The National Synchrotron Light Source

H. Rarback, D. Shu, H. Ade, C. Jacobsen, J. Kirzi, I. McNulty, R. Rosser

Proceedings Volume 0691, X-Ray Imaging II; (1986) https://doi.org/10.1117/12.936628
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

A second generation scanning soft x-ray microscope is under construction, designed to utilize the dramatic increase in source bightness available at the soft x-ray undulator. The new instrument is expected to reduce image acquisition time by a factor of about 100, and to improve resolution, stability, and reproducibility.

Citation Download Citation

H. Rarback, D. Shu, H. Ade, C. Jacobsen, J. Kirzi, I. McNulty, and R. Rosser "An Undulator Based Scanning Microscope At The National Synchrotron Light Source", Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); https://doi.org/10.1117/12.936628

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