12 August 1986 An Undulator Based Scanning Microscope At The National Synchrotron Light Source
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Proceedings Volume 0691, X-Ray Imaging II; (1986); doi: 10.1117/12.936628
Event: 30th Annual Technical Symposium, 1986, San Diego, United States
Abstract
A second generation scanning soft x-ray microscope is under construction, designed to utilize the dramatic increase in source bightness available at the soft x-ray undulator. The new instrument is expected to reduce image acquisition time by a factor of about 100, and to improve resolution, stability, and reproducibility.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. Rarback, D. Shu, H. Ade, C. Jacobsen, J. Kirzi, I. McNulty, R. Rosser, "An Undulator Based Scanning Microscope At The National Synchrotron Light Source", Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); doi: 10.1117/12.936628; https://doi.org/10.1117/12.936628
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KEYWORDS
Microscopes

Beam splitters

X-rays

Light sources

Magnetism

Synchrotrons

Zone plates

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