12 August 1986 Normal Incidence Reflection Multilayer Optics for Solar Soft X-Ray/Extreme Ultraviolet (XUV) Observations
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Abstract
Normal incidence reflection multilayer optics show promise in enabling high spatial resolution (better than 1 arcsec) and low to moderate spectral resolution (λ/▵λ = 8 - 200) imaging in the soft X-ray/XUV spectral regime (40 - 300 Å). In preparation for a Solar X-Ray/XUV Sounding Rocket observation in late 1986 which will utilize normal incidence reflection X-ray optics, several multilayer coatings have been deposited on concave and convex spherical surfaces. The coatings are tungsten-carbon and molybdenum-silicon multilayers and are designed for normal incidence reflection at wavelengths ranging from 44 Å to 304 ⇔. The multilayers havebeen characterized in the laboratory in normal and glancing incidence modes using 1.54 Å to 114 Å radiation. In addition to measuring spectral resolution and absolute reflectivities, multilayer-coated optics have been successfully tested in the imaging mode. This paper will review the measured characteristics of the multilayer coatings and optics and will describe the optical configurations planned for the upcoming solar observation.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joakim F. Lindblom, Joakim F. Lindblom, Arthur B. C. Walker, Arthur B. C. Walker, Troy W. Barbee, Troy W. Barbee, } "Normal Incidence Reflection Multilayer Optics for Solar Soft X-Ray/Extreme Ultraviolet (XUV) Observations", Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); doi: 10.1117/12.936615; https://doi.org/10.1117/12.936615
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