23 February 1987 High Accuracy Emittance Measurement By Newly Designed Portable Device
Author Affiliations +
An emittance meter which utilizes internal standards by Au plated mirror and low temperature blackbody furnace as low and high emittance standards respectively has been developed. The obtained emittance value of which systematic error was compensated had accuracy within ±0.01 and precision within ±0.003. The long term drift of measured emittance value was also checked and confirmed to be within ±0.01 for one year continuous operation.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Sando, M. Sando, A. Fujii, A. Fujii, S. Tanemura, S. Tanemura, T. Noguchi, T. Noguchi, } "High Accuracy Emittance Measurement By Newly Designed Portable Device", Proc. SPIE 0692, Materials and Optics for Solar Energy Conversion and Advanced Lightning Technology, (23 February 1987); doi: 10.1117/12.936696; https://doi.org/10.1117/12.936696

Back to Top