Airborne reconnaissance must move to a real-time capability in the late 1980's and 1990's. Airborne reconnaissance missions will use a variety of sensors including radar, E-0, IR linescanners and FLIRS, which all generate very high data rates. This is particularly true of IR linescan sensors that are used for wide angle viewing in the low level penetration reconnaissance mis-sions. It is clear that machine aided data management is needed for optimum use of all the on-board sensors. The data manage-ment system (DMS) must be capable of adapting to the various sensors so as to manage the collection, processing, recording, airborne display, and radio transmission of the required target data. A very important data processing task is automatic target screening so that data flow can be reduced to feature only those frames that contain candidate targets. This paper briefly reviews Honeywell progress and capabilities in the development and production of Data Management Systems, Data Recording, and Auto-matic 'Parget Cuers. The semiconductor technology being applied by Honeywell to the DMS and autocuer circuitry is also briefly reviewed. The necessary advanced fabrication technology is all available at Honeywell's Signal Processing Technologies Center and includes VLSI and VHSIC Phase II implementations of dense high speed image processing chips. CMOS, Bipolar Enhanced MOS (BEMOS), Digital Bipolar, and Linear Bipolar designs in both silicon and GaAs are used as appropriate. Progress on the algorithms needed to operate the DMS and autocuer hardware is also noted. Laboratory demonstrations of some hardware and algorithms have been done in 1986. Further development in all areas is underway for 1987 and 1988 demonstrations.