14 January 1987 New Write-Once Media Based On Te-Te02 For Optical Disks
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Abstract
Thin film media composed of Te-Te02 (TeOx) containing Pd additive was found to have a feasibility of being applied to high reliability data file optical disks. The carrier to noise ratio (C.N.R.) exceeds 56 dB at 1,200 r.p.m. disk rotation. The response time of saturation amplitude after a pulsed laser power irradiation was less than 300 nsec and is able to apply to high speed read verify systems. From acceleration environmental stress test results, no defect variation was observed. By the Arrhenius plot method, the disk life has been estimated to be more than 10 years at the storage environment 32 degree C, 80 %RH. The recording and degradation mechanism will be also discussed.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takeo Ohta, Takeo Ohta, Koichi Kotera, Koichi Kotera, Kunio Kimura, Kunio Kimura, Nobuo Akahira, Nobuo Akahira, Mutsuo Takenaga, Mutsuo Takenaga, } "New Write-Once Media Based On Te-Te02 For Optical Disks", Proc. SPIE 0695, Optical Mass Data Storage II, (14 January 1987); doi: 10.1117/12.936809; https://doi.org/10.1117/12.936809
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