New Write-Once Media Based On Te-Te02 For Optical Disks

Takeo Ohta; Koichi Kotera; Kunio Kimura; Nobuo Akahira; Mutsuo Takenaga

doi:10.1117/12.936809

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14 January 1987 New Write-Once Media Based On Te-Te02 For Optical Disks

Takeo Ohta, Koichi Kotera, Kunio Kimura, Nobuo Akahira, Mutsuo Takenaga

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Proceedings Volume 0695, Optical Mass Data Storage II; (1987) https://doi.org/10.1117/12.936809
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

Thin film media composed of Te-Te02 (TeOx) containing Pd additive was found to have a feasibility of being applied to high reliability data file optical disks. The carrier to noise ratio (C.N.R.) exceeds 56 dB at 1,200 r.p.m. disk rotation. The response time of saturation amplitude after a pulsed laser power irradiation was less than 300 nsec and is able to apply to high speed read verify systems. From acceleration environmental stress test results, no defect variation was observed. By the Arrhenius plot method, the disk life has been estimated to be more than 10 years at the storage environment 32 degree C, 80 %RH. The recording and degradation mechanism will be also discussed.

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Takeo Ohta, Koichi Kotera, Kunio Kimura, Nobuo Akahira, and Mutsuo Takenaga "New Write-Once Media Based On Te-Te02 For Optical Disks", Proc. SPIE 0695, Optical Mass Data Storage II, (14 January 1987); https://doi.org/10.1117/12.936809

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