The use of acousto-optic and electro-optic signal processing for aiding the testing of high speed and/or high density VLSI circuits is introduced. Various VLSI testing scenarios that involve comparison of the chip output and the expected reference output are discussed. Two acousto-optic architectures are discussed that could be useful for recording and com-paring high speed digital data. Experimental proof-of-principle results are presented along with a prototype processor module. The acousto-optic and electro-optic implementation of a third architecture that is useful for comparing and compressing high speed digital data, is also discussed along with initial experimental results.
A. P. Goutzoulis,
P. J. Chantry,
"Optical Techniques For Aiding VLSI Testing", Proc. SPIE 0698, Real-Time Signal Processing IX, (23 March 1986); doi: 10.1117/12.976265; https://doi.org/10.1117/12.976265