23 March 1986 Optical Techniques For Aiding VLSI Testing
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The use of acousto-optic and electro-optic signal processing for aiding the testing of high speed and/or high density VLSI circuits is introduced. Various VLSI testing scenarios that involve comparison of the chip output and the expected reference output are discussed. Two acousto-optic architectures are discussed that could be useful for recording and com-paring high speed digital data. Experimental proof-of-principle results are presented along with a prototype processor module. The acousto-optic and electro-optic implementation of a third architecture that is useful for comparing and compressing high speed digital data, is also discussed along with initial experimental results.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. P. Goutzoulis, A. P. Goutzoulis, P. J. Chantry, P. J. Chantry, } "Optical Techniques For Aiding VLSI Testing", Proc. SPIE 0698, Real-Time Signal Processing IX, (23 March 1986); doi: 10.1117/12.976265; https://doi.org/10.1117/12.976265


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