10 July 1987 Remote Nondestructive Material Analysis By Photothermal Interferometry
Author Affiliations +
Proceedings Volume 0701, 1986 European Conf on Optics, Optical Systems and Applications; (1987) https://doi.org/10.1117/12.937064
Event: 1986 International European Conference on Optics, Optical Systems, and Applications, 1986, Florence, Italy
Abstract
Interferometry is used for the detection of thermal waves to study material properties. A symmetrical interferometer as thermal expansion detector was developed for photothermal nondestructive material analysis. After mixing a phase shifted reference signal electrically to the interferometer signal, phase and amplitude exchange phenomena have been observed.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Z. Sodnik, Z. Sodnik, H. J. Tiziani, H. J. Tiziani, } "Remote Nondestructive Material Analysis By Photothermal Interferometry", Proc. SPIE 0701, 1986 European Conf on Optics, Optical Systems and Applications, (10 July 1987); doi: 10.1117/12.937064; https://doi.org/10.1117/12.937064
PROCEEDINGS
4 PAGES


SHARE
Back to Top