Reliability Considerations For Optoelectronic Interconnections

Paul W. Shumate

doi:10.1117/12.965192

17 February 1987 Reliability Considerations For Optoelectronic Interconnections

Paul W. Shumate

Proceedings Volume 0703, Integration and Packaging of Optoelectronic Devices; (1987) https://doi.org/10.1117/12.965192
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States

Abstract

At speeds near 1 GHz, power requirements for driving coax and microstrip inter-connections become significant. The difficulty of properly terminating microstrips, particularly fanouts or those with complex conductor paths (such as clock distribution) leads to pulse distortion and reduced noise immunity.

Citation Download Citation

Paul W. Shumate "Reliability Considerations For Optoelectronic Interconnections", Proc. SPIE 0703, Integration and Packaging of Optoelectronic Devices, (17 February 1987); https://doi.org/10.1117/12.965192

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available