17 February 1987 Reliability Considerations For Optoelectronic Interconnections
Author Affiliations +
Proceedings Volume 0703, Integration and Packaging of Optoelectronic Devices; (1987); doi: 10.1117/12.965192
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States
Abstract
At speeds near 1 GHz, power requirements for driving coax and microstrip inter-connections become significant. The difficulty of properly terminating microstrips, particularly fanouts or those with complex conductor paths (such as clock distribution) leads to pulse distortion and reduced noise immunity.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paul W. Shumate, "Reliability Considerations For Optoelectronic Interconnections", Proc. SPIE 0703, Integration and Packaging of Optoelectronic Devices, (17 February 1987); doi: 10.1117/12.965192; https://doi.org/10.1117/12.965192
PROCEEDINGS
4 PAGES


SHARE
KEYWORDS
Reliability

Light emitting diodes

Silicon

Semiconductor lasers

Gallium arsenide

Sensors

Germanium

Back to Top