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10 March 1987 Optical Damage Effects In Z-Propagating LiNbO3 Channel Waveguides Fabricated On X- And Y-Cut Substrates
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Proceedings Volume 0704, Integrated Optical Circuit Engineering IV; (1987) https://doi.org/10.1117/12.937197
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States
Abstract
Channel waveguides produced parallel to the z-axis in x as well as y-cut LiNbO3 by Ti indiffusion are found to display severe optical damage in the form of coupling between TE and TM modes for power levels in the range of 1-100 microwatts at wavelengths of .633 and .488 microns. Previously, this orientation was thought to display little or no damage. The effect is manifest by both a steady state power dependent transfer of as much as 30% optical energy between orthogonally polarized modes as well as a transient regenerative switching between these modes seen only in x-cut samples subjected to continuous optical throughput at the above power levels for a period of 8-24 hours. A model of the observations is proposed based on photorefractive perturbations
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. A. Sanford and W. C. Robinson "Optical Damage Effects In Z-Propagating LiNbO3 Channel Waveguides Fabricated On X- And Y-Cut Substrates", Proc. SPIE 0704, Integrated Optical Circuit Engineering IV, (10 March 1987); https://doi.org/10.1117/12.937197
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