10 March 1987 The Application Of Transmission Electron Microscopy To The Study Of Microstructures In Linbo3 Optical
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Proceedings Volume 0704, Integrated Optical Circuit Engineering IV; (1987); doi: 10.1117/12.937167
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States
Abstract
The basic principles of Transmission Electron Microscopy are outlined and examples of microstructures observed in LiNbO3, waveguides reported. Defects present in the waveguides may have significant effects on their waveguiding ability. Various speculative arguments are suggested for the influence of these defects on the waveguide.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. E. Lee, "The Application Of Transmission Electron Microscopy To The Study Of Microstructures In Linbo3 Optical", Proc. SPIE 0704, Integrated Optical Circuit Engineering IV, (10 March 1987); doi: 10.1117/12.937167; https://doi.org/10.1117/12.937167
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KEYWORDS
Waveguides

Transmission electron microscopy

Diffraction

Crystals

Ions

Objectives

Photonic integrated circuits

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