23 February 1987 High Reliability, All Solder Construction Pinfet Receiver Using Passivated Ingaas Pin Photodetector
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Proceedings Volume 0717, Reliability Considerations in Fiber Optic Applications; (1987) https://doi.org/10.1117/12.937481
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States
Abstract
A highly reliable PINFET has been developed and manufactured by all solder construction using passivated InGaAs PIN photodetector. At operation voltage of -5V, the PIN pnotodetector has typical characteristics of 3nA in dark current, 0.3pF in capacitance and 0.75A/W in responsivity. The PINFET receiver circuit is designed using these PIN photodetectors. Extensive SPICE simulation has been performed to reduce the effect of stray capacitances thus to improve the manufacturing yield and quality to meet the 3σstatistical limits for all the parameters. Lifetests have been performed on the 16 PIN photodetectors and 10 fully packaged PINFETs with equivalent room temperature operation of 1.7 x 107 and 2.2 x 105 hours respectively without failure.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kennetn K Li, Kennetn K Li, Tr an Van Muoi, Tr an Van Muoi, } "High Reliability, All Solder Construction Pinfet Receiver Using Passivated Ingaas Pin Photodetector", Proc. SPIE 0717, Reliability Considerations in Fiber Optic Applications, (23 February 1987); doi: 10.1117/12.937481; https://doi.org/10.1117/12.937481
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