Paper
14 January 1987 Modulation Performance Of 1.3 and 1.51 µm InGaAsP Buried Crescent Injection Lasers With Semi-Insulating Current Confinement Layer
W. H. Cheng, C. B. Su, K. D. Buehring, C. P. Chien, J. W. Ure, D. Perrachione, D. Renner, K. L. Hess, S. W. Zehr
Author Affiliations +
Proceedings Volume 0723, Progress in Semiconductor Laser Diodes; (1987) https://doi.org/10.1117/12.937683
Event: Cambridge Symposium-Fiber/LASE '86, 1986, Cambridge, MA, United States
Abstract
A hybrid growth technique has been used to fabricate low threshold 1.51 and 1.3 µm InGaAsP buried crescent (BC) injection lasers with a semi-insulating current confinement layer. The technique involves a first stage of low pressure metal organic chemical vapor deposition (LPMOCVD) followed by a liquid phase epitaxy (LPE) stage. The BC lasers exhibit CW threshold currents as low as 12 mA at 25'C, high yield, differential quantum efficiency over 41%, and output power more than 18 mW. Small-signal modulation response to 3.5 GHz and 5 GHz has been obtained for 1.51 and 1.3 um laser respectively. The BC lasers show an initial small degradation rate of 1%/kh at 50'C which gives an estimated operating lifetime of 47 years at 25'C.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. H. Cheng, C. B. Su, K. D. Buehring, C. P. Chien, J. W. Ure, D. Perrachione, D. Renner, K. L. Hess, and S. W. Zehr "Modulation Performance Of 1.3 and 1.51 µm InGaAsP Buried Crescent Injection Lasers With Semi-Insulating Current Confinement Layer", Proc. SPIE 0723, Progress in Semiconductor Laser Diodes, (14 January 1987); https://doi.org/10.1117/12.937683
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KEYWORDS
Liquid phase epitaxy

Modulation

Laser damage threshold

Pulsed laser operation

Metalorganic chemical vapor deposition

Continuous wave operation

Semiconductor lasers

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