18 May 1987 Data Conversion Method And Processor For Binary Patterns
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Proceedings Volume 0730, Automated Inspection and Measurement; (1987) https://doi.org/10.1117/12.937851
Event: Cambridge Symposium_Intelligent Robotics Systems, 1986, Cambridge, MA, United States
A raster-scan algorithm and the corresponding hardware implementation for the approximation of binary pattern edges with line segments is described. The generated representation is more suitable for processing by conventional microprocessors than raw binary images or chain-code descriptions. The approach is used in an experimental printed wiring board inspection system.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Olli Silven, Olli Silven, Ilkka Virtanen, Ilkka Virtanen, } "Data Conversion Method And Processor For Binary Patterns", Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937851; https://doi.org/10.1117/12.937851

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