18 May 1987 Opto-Electronic Profile Measuring System
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Proceedings Volume 0730, Automated Inspection and Measurement; (1987) https://doi.org/10.1117/12.937860
Event: Cambridge Symposium_Intelligent Robotics Systems, 1986, Cambridge, MA, United States
Abstract
The basic idea of a simple, but powerful opto-electronic profile measuring system and three practical examples are described. In general these systems are combinations of classical light sectioning techniques, modern sensors and special digital hardware components. Further applications, e.g. in the steel or automotive industry are possible.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Harald J. Schmalfuss, Harald J. Schmalfuss, } "Opto-Electronic Profile Measuring System", Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); doi: 10.1117/12.937860; https://doi.org/10.1117/12.937860
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