26 August 1987 "Continuous" Pulsed Electronic Speckle Pattern Interferometry
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Proceedings Volume 0732, 1st Intl Conf on Vibration Control in Optics and Metrology; (1987) https://doi.org/10.1117/12.937913
Event: 1st International Conference on Vibrational Control in Optics and Metrology, 1987, London, United Kingdom
Abstract
Holography and allied techliques such as electronic speckle pattern interferometry (ESPI) have the potential to provide the engineer with a powerful measuring technique. Why, therefore, is it not a technique readily available and widely used? Several arguments can be put forward; complexity, skill level, ease of use, in-situ capability, and ability to interpret results.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John R. Tyrer, John R. Tyrer, ""Continuous" Pulsed Electronic Speckle Pattern Interferometry", Proc. SPIE 0732, 1st Intl Conf on Vibration Control in Optics and Metrology, (26 August 1987); doi: 10.1117/12.937913; https://doi.org/10.1117/12.937913
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