10 April 1987 "Stabilizing Laser Frequencies For Metrology Applications"
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Proceedings Volume 0741, Design of Optical Systems Incorporating Low Power Lasers; (1987); doi: 10.1117/12.939752
Event: OE LASE'87 and EO Imaging Symposium, 1987, Los Angeles, CA, United States
Abstract
Frequency stability plays a crucial role for laser metrological applications. This paper first reviews the laser as a measurement tool in metrology. The techniques of laser frequency stabilization for metrological applications are then discussed from physical and engineering points of view. Finally, an example of recent advance in laser frequency stabilization is presented.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John C. Tsai, ""Stabilizing Laser Frequencies For Metrology Applications"", Proc. SPIE 0741, Design of Optical Systems Incorporating Low Power Lasers, (10 April 1987); doi: 10.1117/12.939752; https://doi.org/10.1117/12.939752
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KEYWORDS
Laser stabilization

Metrology

Semiconductor lasers

Distance measurement

Laser applications

Optical design

Lasers

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