1 January 1987 Fluorescence Probes For Study Of Damage In Dielectrics
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Proceedings Volume 0743, Fluorescence Detection; (1987) https://doi.org/10.1117/12.966927
Event: OE LASE'87 and EO Imaging Symposium, 1987, Los Angeles, CA, United States
A novel approach to investigation of electrical damage in insulators is described. It involves the use of fluorescence probes that selectively stain the damage features of interest or that react at specific sites, changing their fluorescence characteristics. Because of the sensitivity laser excited fluorescence provides, surface flashover tracks, locations of corona discharge and other features are easily revealed even when no damage is discernible in room light. Our results show that structural features, charge distributions, and chemical changes caused by electrical damage may be probed. Some surprising features of insulator damage revealed by fluorescence probes are presented.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. R. Menzel, E. R. Menzel, L. L. Hatfield, L. L. Hatfield, V. K. Agarwal, V. K. Agarwal, W. G. Linzey, W. G. Linzey, J. D. Smith, J. D. Smith, } "Fluorescence Probes For Study Of Damage In Dielectrics", Proc. SPIE 0743, Fluorescence Detection, (1 January 1987); doi: 10.1117/12.966927; https://doi.org/10.1117/12.966927

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