This paper reports on the characterization of CMOS detectors for holographic optical interconnects in microcircuits. A VLSI temporal response system has been built, which has high-magnification viewing capabilities to facilitate identifying the sample area under investigation. A isolated photodiode and load circuit has been characterized to determine responsivity, response time and light spot positioning effects. The threshold of optical gate cells (OGC) incorporating the above detectors and a transistor inverter stage to couple to other circuitry has been determined. The rise time and fall time of the optical gate cells have also been determined experimentally. The results were compared with the results of SPICE simulation, and show satisfactory agreement. The time delay of optical gate cell output was thus determined to be 70 ns at 10 μW light input. Threshold power was 0.5 μW light input.