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1 January 1987 Noise Characterization And Reduction In A Scanning Microdensitometer
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High-speed scanning microdensitometers are now used routinely to characterize the noise in applications such as radiographic screen-film systems and the films used for hard copy output of digital printers. These measurements are often limited by the internal sources of noise in such instruments. We have analyzed the principal sources of noise in a commercially available, two-dimensional scanning microdensitometer and have found them to be associated with either the glass platen (which noise is correlated from scan to scan) or other sources which are uncorrelated from scan to scan, depending on film density. These component noise sources, as well as the total instrument noise, have been measured as a function of density and spatial frequency. Methods for reducing these noise components, including a cross-spectrum technique, are reviewed and their utility is demonstrated by application to the estimation of noise power spectra of a radiographic screen-film system.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Phillip C. Bunch and Richard Van Metter "Noise Characterization And Reduction In A Scanning Microdensitometer", Proc. SPIE 0767, Medical Imaging, (1 January 1987);

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