24 September 1987 PtSi Internal Photoemission; Theory And Experiment
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Abstract
The process of internal photoemission is analyzed from both a theoretical and an experimental point of view. A recent model of the internal photoemission process is compared with measured data. The comparison lends credence to the model and yields results which can be used to optimize the performance of Schottky barrier infrared detectors.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan M. Mooney, Jonathan M. Mooney, Jerry Silverman, Jerry Silverman, Melanie M. Weeks, Melanie M. Weeks, } "PtSi Internal Photoemission; Theory And Experiment", Proc. SPIE 0782, Infrared Sensors and Sensor Fusion, (24 September 1987); doi: 10.1117/12.940563; https://doi.org/10.1117/12.940563
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