3 August 1987 Picosecond Time-Resolved Photoluminescence From Cd1-xMnxTe-CdTe Microstructures
Author Affiliations +
Proceedings Volume 0793, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors; (1987) https://doi.org/10.1117/12.940859
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States
Exciton lifetimes in Cdi-xMnxTe-CdTe superlattices (x = 0.06, 0.23 and 0.45) at 7 K have been studied by time-correlated single photon counting with high spectral resolution. The lifetimes decrease with well thickness, in agreement with earlier spectrally integrated luminescence decay measurements using a spectrometer/streak camera combination. Our spectral resolution is sufficient to show small structure for the Cd0.5Mn0.45Te-CdTe sample at energies near those predicted by a Kronig-Penny calculation for the subbands, and we report the time behavior of these states.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. S. Yom, S. S. Yom, S. Perkowitz, S. Perkowitz, "Picosecond Time-Resolved Photoluminescence From Cd1-xMnxTe-CdTe Microstructures", Proc. SPIE 0793, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors, (3 August 1987); doi: 10.1117/12.940859; https://doi.org/10.1117/12.940859

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