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3 August 1987 Optimal Performance Of An Electro-Optical Sampler
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Proceedings Volume 0793, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors; (1987)
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States
An electro-optical sampler is used to measure the electric potential generated by a device under test. However, the sampler actually measures the change in polarization of a laser beam in the electro-optic crystal, caused by the electric field from striplines to which the device has been connected. In order to relate this measured effect to the actual potential produced by the device, it is necessary to have a detailed knowledge of the stripline characteristics. It will be shown that in a typical three strip geometry, the half wave voltage can vary by 10% across the striplines due to curved electric fields.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeffrey Lindemuth "Optimal Performance Of An Electro-Optical Sampler", Proc. SPIE 0793, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors, (3 August 1987);

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