Far Infrared Reflectance Spectroscopy Of AlAs-GaAs Microstructures

R. Sudharsanan; S. Perkowitz; S. S. Yom; T. J. Drummond

doi:10.1117/12.940914

22 April 1987 Far Infrared Reflectance Spectroscopy Of AlAs-GaAs Microstructures

R. Sudharsanan, S. Perkowitz, S. S. Yom, T. J. Drummond

Proceedings Volume 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices; (1987) https://doi.org/10.1117/12.940914
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States

Abstract

We report infrared reflectance spectra in the range 100-450 cm^-1 for an AlAs-GaAs heterostructure and three AlAs-GaAs superlattices with different periods. All the spectra clearly exhibit the TO phonon modes of pure GaAs and AlAs and a sharp interference peak at the GaAs LO frequency. The heterostructure data yield a set of phonon parameters for unoxidised AlAs. The superlattice spectra exhibit additional structure between 225 and 400 cm^-1 and a broadening of the GaAs TO peak. The long wavelength superlattice optical theory of Agranovich and Kravtsov explains most of the features of the superlattice reflectivity.

Citation Download Citation

R. Sudharsanan, S. Perkowitz, S. S. Yom, and T. J. Drummond "Far Infrared Reflectance Spectroscopy Of AlAs-GaAs Microstructures", Proc. SPIE 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices, (22 April 1987); https://doi.org/10.1117/12.940914

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